Elmira Karimi, Mohammad Hashem Haghbayan, Amir-Mohammad Rahmani, Mahmoud Tabandeh, Pasi Liljeberg, Zainalabedin Navabi. Accelerated On-chip Communication Test Methodology Using a Novel High-Level Fault Model. In IEEE 9th International Symposium on Embedded Multicore/Many-core Systems-on-Chip, MCSoC 2015, Turin, Italy, September 23-25, 2015. pages 283-288, IEEE, 2015. [doi]
@inproceedings{KarimiHRTLN15,
title = {Accelerated On-chip Communication Test Methodology Using a Novel High-Level Fault Model},
author = {Elmira Karimi and Mohammad Hashem Haghbayan and Amir-Mohammad Rahmani and Mahmoud Tabandeh and Pasi Liljeberg and Zainalabedin Navabi},
year = {2015},
doi = {10.1109/MCSoC.2015.46},
url = {http://dx.doi.org/10.1109/MCSoC.2015.46},
researchr = {https://researchr.org/publication/KarimiHRTLN15},
cites = {0},
citedby = {0},
pages = {283-288},
booktitle = {IEEE 9th International Symposium on Embedded Multicore/Many-core Systems-on-Chip, MCSoC 2015, Turin, Italy, September 23-25, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8670-5},
}