Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby. A Parallel Approach for Testing Multi-Port Static Random Access Memories. In 9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, CA, USA. pages 73, IEEE Computer Society, 2001. [doi]
Abstract is missing.