Rajit Karmakar, Santanu Chattopadhyay. Thermal-Safe Schedule Generation for System-on-Chip Testing. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 475-480, IEEE Computer Society, 2016. [doi]
@inproceedings{KarmakarC16,
title = {Thermal-Safe Schedule Generation for System-on-Chip Testing},
author = {Rajit Karmakar and Santanu Chattopadhyay},
year = {2016},
doi = {10.1109/VLSID.2016.47},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2016.47},
researchr = {https://researchr.org/publication/KarmakarC16},
cites = {0},
citedby = {0},
pages = {475-480},
booktitle = {29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8700-2},
}