Rajit Karmakar, Santanu Chattopadhyay. Thermal-Safe Schedule Generation for System-on-Chip Testing. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 475-480, IEEE Computer Society, 2016. [doi]
Abstract is missing.