Aditya P. Karmarkar, Xiaopeng Xu, Victor Moroz, Greg Rollins, Xiao Lin. Analysis of performance and reliability trade-off in dummy pattern design for 32-nm technology. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 185-189, IEEE, 2009. [doi]
Abstract is missing.