Detection and identification of input/output stuck-at and bridging faults in combinational and sequential VLSI networks by universal tests

Mark G. Karpovsky, Lev B. Levitin. Detection and identification of input/output stuck-at and bridging faults in combinational and sequential VLSI networks by universal tests. Integration, 1(2-3):211-232, 1983. [doi]

Abstract

Abstract is missing.