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An approach to the testing of microprocessors

Mark G. Karpovsky, Rodney Van Meter. An approach to the testing of microprocessors. In Patricia H. Lambert, Hillel Ofek, Lawrence A. O'Neill, Pat O. Pistilli, Paul Losleben, J. D. Nash, Dennis W. Shaklee, Bryan T. Preas, Harvey N. Lerman, editors, Proceedings of the 21st Design Automation Conference, DAC '84, Albuquerque, New Mexico, June 25-27, 1984. pages 196-202, ACM/IEEE, 1984. [doi]

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Mark G. Karpovsky

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Rodney Van Meter

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