Mark G. Karpovsky, Rodney Van Meter. An approach to the testing of microprocessors. In Patricia H. Lambert, Hillel Ofek, Lawrence A. O'Neill, Pat O. Pistilli, Paul Losleben, J. D. Nash, Dennis W. Shaklee, Bryan T. Preas, Harvey N. Lerman, editors, Proceedings of the 21st Design Automation Conference, DAC '84, Albuquerque, New Mexico, June 25-27, 1984. pages 196-202, ACM/IEEE, 1984. [doi]
@inproceedings{KarpovskyM84,
title = {An approach to the testing of microprocessors},
author = {Mark G. Karpovsky and Rodney Van Meter},
year = {1984},
url = {http://dl.acm.org/citation.cfm?id=800795},
researchr = {https://researchr.org/publication/KarpovskyM84},
cites = {0},
citedby = {0},
pages = {196-202},
booktitle = {Proceedings of the 21st Design Automation Conference, DAC '84, Albuquerque, New Mexico, June 25-27, 1984},
editor = {Patricia H. Lambert and Hillel Ofek and Lawrence A. O'Neill and Pat O. Pistilli and Paul Losleben and J. D. Nash and Dennis W. Shaklee and Bryan T. Preas and Harvey N. Lerman},
publisher = {ACM/IEEE},
isbn = {0-8186-0542-1},
}