BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies

Aadithya V. Karthik, Sayak Ray, Jaijeet Roychowdhury. BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 366-371, IEEE, 2015. [doi]

Authors

Aadithya V. Karthik

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Sayak Ray

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Jaijeet Roychowdhury

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