Aadithya V. Karthik, Sayak Ray, Jaijeet Roychowdhury. BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 366-371, IEEE, 2015. [doi]
Abstract is missing.