Aadithya V. Karthik, Sayak Ray, Jaijeet Roychowdhury. BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 366-371, IEEE, 2015. [doi]
@inproceedings{KarthikRR15, title = {BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies}, author = {Aadithya V. Karthik and Sayak Ray and Jaijeet Roychowdhury}, year = {2015}, doi = {10.1109/ASPDAC.2015.7059032}, url = {http://dx.doi.org/10.1109/ASPDAC.2015.7059032}, researchr = {https://researchr.org/publication/KarthikRR15}, cites = {0}, citedby = {0}, pages = {366-371}, booktitle = {The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015}, publisher = {IEEE}, isbn = {978-1-4799-7792-5}, }