BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies

Aadithya V. Karthik, Sayak Ray, Jaijeet Roychowdhury. BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 366-371, IEEE, 2015. [doi]

@inproceedings{KarthikRR15,
  title = {BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies},
  author = {Aadithya V. Karthik and Sayak Ray and Jaijeet Roychowdhury},
  year = {2015},
  doi = {10.1109/ASPDAC.2015.7059032},
  url = {http://dx.doi.org/10.1109/ASPDAC.2015.7059032},
  researchr = {https://researchr.org/publication/KarthikRR15},
  cites = {0},
  citedby = {0},
  pages = {366-371},
  booktitle = {The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015},
  publisher = {IEEE},
  isbn = {978-1-4799-7792-5},
}