Chandramouli V. Kashyap, Charles J. Alpert, Anirudh Devgan. An Effective Capacitance Based Delay Metric for RC Interconnect. In Ellen Sentovich, editor, Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000. pages 229-234, IEEE, 2000.
Abstract is missing.