Computer-aided detection of plagiarism in integrated-circuit layouts

Dominik Kasprowicz, Hilekaan Wada. Computer-aided detection of plagiarism in integrated-circuit layouts. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 213-217, IEEE, 2013. [doi]

Abstract

Abstract is missing.