Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga. Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1008-1013, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Kenichi Kataoka' in GoogleThis author has not been identified. Look up 'Toshihiro Itoh' in GoogleThis author has not been identified. Look up 'Tadatomo Suga' in Google

runs on WebDSL