Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga. Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1008-1013, IEEE Computer Society, 2003. [doi]
Abstract is missing.