Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga. Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1008-1013, IEEE Computer Society, 2003. [doi]
@inproceedings{KataokaIS03,
title = {Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers},
author = {Kenichi Kataoka and Toshihiro Itoh and Tadatomo Suga},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631008abs.htm},
researchr = {https://researchr.org/publication/KataokaIS03},
cites = {0},
citedby = {0},
pages = {1008-1013},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}