Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis - researchr publication authors

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Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato. Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 703-708, IEEE, 2010. [doi]

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