Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis

Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato. Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 703-708, IEEE, 2010. [doi]

Abstract

Abstract is missing.