A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator

Kentaroh Katoh, Yutaro Kobayashi, Takeshi Chujo, Junshan Wang, Ensi Li, Congbing Li, Haruo Kobayashi. A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator. J. Electronic Testing, 30(6):653-663, 2014. [doi]

Abstract

Abstract is missing.