High Reliability Delay-Based Weak FPGA PUF Using High-Resolution Stochastic Delay Measurement With Phase Locked Loops - researchr publication

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Kentaroh Katoh, Toru Nakura, Haruo Kobayashi 0001. High Reliability Delay-Based Weak FPGA PUF Using High-Resolution Stochastic Delay Measurement With Phase Locked Loops. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 458-461, IEEE, 2025. [doi]

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