Arshdeep Kaur, Sayandeep Saha, Chandan Karfa, Debdeep Mukhopadhyay. Corruption Exposes You: Statistical Key Recovery from Compound Logic Locking. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{KaurSKM22,
title = {Corruption Exposes You: Statistical Key Recovery from Compound Logic Locking},
author = {Arshdeep Kaur and Sayandeep Saha and Chandan Karfa and Debdeep Mukhopadhyay},
year = {2022},
doi = {10.1109/ISQED54688.2022.9806219},
url = {https://doi.org/10.1109/ISQED54688.2022.9806219},
researchr = {https://researchr.org/publication/KaurSKM22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9466-3},
}