Arshdeep Kaur, Sayandeep Saha, Chandan Karfa, Debdeep Mukhopadhyay. Corruption Exposes You: Statistical Key Recovery from Compound Logic Locking. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.