Amrit Mohan Kaushik, Raghava Mutharaju. An Ontology Design Pattern for Modeling Bias. In Eva Blomqvist, Torsten Hahmann, Karl Hammar, Pascal Hitzler, Rinke Hoekstra, Raghava Mutharaju, María Poveda-Villalón, Cogan Shimizu, Martin G. Skjæveland, Monika Solanki, Vojtech Svátek, Lu Zhou, editors, Advances in Pattern-Based Ontology Engineering, extended versions of the papers published at the Workshop on Ontology Design and Patterns (WOP). Volume 51 of Studies on the Semantic Web, pages 337-348, IOS Press, 2021. [doi]
Abstract is missing.