Mohammadamir Kavousi, Liang Chen, Sheldon X.-D. Tan. Fast Electromigration Stress Analysis Considering Spatial Joule Heating Effects. In 27th Asia and South Pacific Design Automation Conference, ASP-DAC 2022, Taipei, Taiwan, January 17-20, 2022. pages 208-213, IEEE, 2022. [doi]
@inproceedings{KavousiCT22,
title = {Fast Electromigration Stress Analysis Considering Spatial Joule Heating Effects},
author = {Mohammadamir Kavousi and Liang Chen and Sheldon X.-D. Tan},
year = {2022},
doi = {10.1109/ASP-DAC52403.2022.9712535},
url = {https://doi.org/10.1109/ASP-DAC52403.2022.9712535},
researchr = {https://researchr.org/publication/KavousiCT22},
cites = {0},
citedby = {0},
pages = {208-213},
booktitle = {27th Asia and South Pacific Design Automation Conference, ASP-DAC 2022, Taipei, Taiwan, January 17-20, 2022},
publisher = {IEEE},
isbn = {978-1-6654-2135-5},
}