The following publications are possibly variants of this publication:
- Electromigration assessment for power grid networks considering temperature and thermal stress effectsXin Huang, Valeriy Sukharev, Jun-Ho Choy, Marko Chew, Taeyoung Kim, Sheldon X.-D. Tan. integration, 55:307-315, 2016. [doi]
- Electromigration Immortality Check considering Joule Heating Effect for Multisegment Wires**This work is supported in part by NSF grants under No. CCF-1816361, in part by NSF grant under No. CCF-2007135 and No. OISE-1854276Mohammadamir Kavousi, Liang Chen, Sheldon X.-D. Tan. iccad 2020: 1-8 [doi]