Generation of compact test sets with high defect coverage

Xrysovalantis Kavousianos, Krishnendu Chakrabarty. Generation of compact test sets with high defect coverage. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1130-1135, IEEE, 2009. [doi]

Authors

Xrysovalantis Kavousianos

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Krishnendu Chakrabarty

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