Xrysovalantis Kavousianos, Krishnendu Chakrabarty. Generation of compact test sets with high defect coverage. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1130-1135, IEEE, 2009. [doi]
@inproceedings{KavousianosC09, title = {Generation of compact test sets with high defect coverage}, author = {Xrysovalantis Kavousianos and Krishnendu Chakrabarty}, year = {2009}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090833&count=326&index=219}, tags = {test coverage, testing, coverage}, researchr = {https://researchr.org/publication/KavousianosC09}, cites = {0}, citedby = {0}, pages = {1130-1135}, booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009}, publisher = {IEEE}, }