Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros. Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. VLSI Syst., 19(12):2330-2335, 2011. [doi]
@article{KavousianosTCK11,
title = {Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets},
author = {Xrysovalantis Kavousianos and Vasileios Tenentes and Krishnendu Chakrabarty and Emmanouil Kalligeros},
year = {2011},
doi = {10.1109/TVLSI.2010.2079961},
url = {http://dx.doi.org/10.1109/TVLSI.2010.2079961},
researchr = {https://researchr.org/publication/KavousianosTCK11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {19},
number = {12},
pages = {2330-2335},
}