Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets - researchr publication

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Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros. Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. VLSI Syst., 19(12):2330-2335, 2011. [doi]

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