Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi. Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. In International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017. pages 2-7, IEEE, 2017. [doi]
Abstract is missing.