Highly-reliable TaOx reram technology using automatic forming circuit - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ken Kawai, Akifumi Kawahara, Ryutaro Yasuhara, Shunsaku Muraoka, Zhiqiang Wei, Ryotaro Azuma, Kouhei Tanabe, Kazuhiko Shimakawa. Highly-reliable TaOx reram technology using automatic forming circuit. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

This author has not been identified. Look up 'Ken Kawai' in GoogleThis author has not been identified. Look up 'Akifumi Kawahara' in GoogleThis author has not been identified. Look up 'Ryutaro Yasuhara' in GoogleThis author has not been identified. Look up 'Shunsaku Muraoka' in GoogleThis author has not been identified. Look up 'Zhiqiang Wei' in GoogleThis author has not been identified. Look up 'Ryotaro Azuma' in GoogleThis author has not been identified. Look up 'Kouhei Tanabe' in GoogleThis author has not been identified. Look up 'Kazuhiko Shimakawa' in Google

runs on WebDSL