Ken Kawai, Akifumi Kawahara, Ryutaro Yasuhara, Shunsaku Muraoka, Zhiqiang Wei, Ryotaro Azuma, Kouhei Tanabe, Kazuhiko Shimakawa. Highly-reliable TaOx reram technology using automatic forming circuit. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{KawaiKYMWATS14,
title = {Highly-reliable TaOx reram technology using automatic forming circuit},
author = {Ken Kawai and Akifumi Kawahara and Ryutaro Yasuhara and Shunsaku Muraoka and Zhiqiang Wei and Ryotaro Azuma and Kouhei Tanabe and Kazuhiko Shimakawa},
year = {2014},
doi = {10.1109/ICICDT.2014.6838600},
url = {http://dx.doi.org/10.1109/ICICDT.2014.6838600},
researchr = {https://researchr.org/publication/KawaiKYMWATS14},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014},
publisher = {IEEE},
isbn = {978-1-4799-2153-9},
}