Shoichiro Kawashima, Isao Fukushi, Keizo Morita, Ken-ichi Nakabayashi, Mitsuharu Nakazawa, Kazuaki Yamane, Tomohisa Hirayama, Toru Endo. A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. IEICE Transactions, 90-C(10):1941-1948, 2007. [doi]
Abstract is missing.