Mehmet Kayaalp, Fahrettin Koc, Oguz Ergin. Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation due to Electromigration. In 15th Euromicro Conference on Digital System Design, DSD 2012, Cesme, Izmir, Turkey, September 5-8, 2012. pages 280-287, IEEE, 2012. [doi]
Abstract is missing.