Hideto Kayashima, Hideharu Amano. TCI Tester: Tester for Through Chip Interface. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 103-104, ACM, 2021. [doi]
@inproceedings{KayashimaA21,
title = {TCI Tester: Tester for Through Chip Interface},
author = {Hideto Kayashima and Hideharu Amano},
year = {2021},
doi = {10.1145/3394885.3431660},
url = {https://doi.org/10.1145/3394885.3431660},
researchr = {https://researchr.org/publication/KayashimaA21},
cites = {0},
citedby = {0},
pages = {103-104},
booktitle = {ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021},
publisher = {ACM},
isbn = {978-1-4503-7999-1},
}