Wuudiann Ke, Premachandran R. Menon. Multifault testability of delay-testable circuits. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 400-409, IEEE Computer Society, 1995. [doi]
@inproceedings{KeM95,
title = {Multifault testability of delay-testable circuits},
author = {Wuudiann Ke and Premachandran R. Menon},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000400abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KeM95},
cites = {0},
citedby = {0},
pages = {400-409},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}