Chao-Yang Ke, Yu-Chia Tsui, Bing-Yue Tsui, Ming-Dou Ker. Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.