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Stack Sizing for Optimal Current Drivability in Subthreshold Circuits

John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S. Sapatnekar, Chris H. Kim. Stack Sizing for Optimal Current Drivability in Subthreshold Circuits. IEEE Trans. VLSI Syst., 16(5):598-602, 2008. [doi]

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John Keane

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Hanyong Eom

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Tae-Hyoung Kim

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Sachin S. Sapatnekar

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Chris H. Kim

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