John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S. Sapatnekar, Chris H. Kim. Stack Sizing for Optimal Current Drivability in Subthreshold Circuits. IEEE Trans. VLSI Syst., 16(5):598-602, 2008. [doi]
@article{KeaneEKSK08,
title = {Stack Sizing for Optimal Current Drivability in Subthreshold Circuits},
author = {John Keane and Hanyong Eom and Tae-Hyoung Kim and Sachin S. Sapatnekar and Chris H. Kim},
year = {2008},
doi = {10.1109/TVLSI.2008.917571},
url = {http://dx.doi.org/10.1109/TVLSI.2008.917571},
researchr = {https://researchr.org/publication/KeaneEKSK08},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {16},
number = {5},
pages = {598-602},
}