An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization

John Keane, Wei Zhang 0032, Chris H. Kim. An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization. J. Solid-State Circuits, 46(10):2374-2385, 2011. [doi]

Authors

John Keane

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Wei Zhang 0032

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Chris H. Kim

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