John Keane, Wei Zhang 0032, Chris H. Kim. An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization. J. Solid-State Circuits, 46(10):2374-2385, 2011. [doi]
@article{KeaneZK11,
title = {An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization},
author = {John Keane and Wei Zhang 0032 and Chris H. Kim},
year = {2011},
doi = {10.1109/JSSC.2011.2160813},
url = {http://dx.doi.org/10.1109/JSSC.2011.2160813},
researchr = {https://researchr.org/publication/KeaneZK11},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {46},
number = {10},
pages = {2374-2385},
}