MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing - researchr publication authors

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David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop. MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design, 2008, 2008. [doi]

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