MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop. MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design, 2008, 2008. [doi]

Abstract

Abstract is missing.