David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop. MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design, 2008, 2008. [doi]
@article{KeezerMDVFM08,
title = {MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing},
author = {David C. Keezer and Dany Minier and Patrice Ducharme and Doris Viens and Greg Flynn and John McKillop},
year = {2008},
doi = {10.1155/2008/291686},
url = {http://dx.doi.org/10.1155/2008/291686},
tags = {testing, C++, logic},
researchr = {https://researchr.org/publication/KeezerMDVFM08},
cites = {0},
citedby = {0},
journal = {VLSI Design},
volume = {2008},
}