Terabit-per-second automated digital testing

David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole. Terabit-per-second automated digital testing. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1143-1189, IEEE Computer Society, 2001.

Authors

David C. Keezer

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Q. Zhou

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C. Bair

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J. Kuan

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B. Poole

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