Terabit-per-second automated digital testing

David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole. Terabit-per-second automated digital testing. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1143-1189, IEEE Computer Society, 2001.

@inproceedings{KeezerZBKP01,
  title = {Terabit-per-second automated digital testing},
  author = {David C. Keezer and Q. Zhou and C. Bair and J. Kuan and B. Poole},
  year = {2001},
  tags = {testing, C++},
  researchr = {https://researchr.org/publication/KeezerZBKP01},
  cites = {0},
  citedby = {0},
  pages = {1143-1189},
  booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-7169-0},
}