T. Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, F. La Rosa, Stephan Niel, Arnaud Régnier, Jean Michel Portal, Pascal Masson. Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6, IEEE, 2018. [doi]
@inproceedings{KempfMBMRNRPM18,
title = {Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip},
author = {T. Kempf and Vincenzo Della Marca and L. Baron and F. Maugain and F. La Rosa and Stephan Niel and Arnaud Régnier and Jean Michel Portal and Pascal Masson},
year = {2018},
doi = {10.1109/IRPS.2018.8353642},
url = {https://doi.org/10.1109/IRPS.2018.8353642},
researchr = {https://researchr.org/publication/KempfMBMRNRPM18},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}