The following publications are possibly variants of this publication:
- An Efficient, Wide-Output, High-Voltage Charge Pump With a Stage Selection Circuit Realized in a Low-Voltage CMOS ProcessZhicong Luo, Li-Chin Yu, Ming-Dou Ker. tcas, 66-I(9):3437-3444, 2019. [doi]
- Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS processYi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker. mr, 51(5):871-878, 2011. [doi]
- A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide Reliability in Low-Voltage CMOS ProcessesTzu-Ming Wang, Wan-Yi Shen, Ming-Dou Ker. icecsys 2007: 206-209 [doi]
- Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processesMing-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai. jssc, 41(5):1100-1107, 2006. [doi]