Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technology - researchr publication authors

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Ming-Dou Ker, Wei-Jen Chang. Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technology. Microelectronics Reliability, 47(1):27-35, 2007. [doi]

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