Electrostatic Discharge Protection Design for High-Voltage Programming Pin in Fully-Silicided CMOS ICs

Ming-Dou Ker, Wen-Yi Chen, Wuu-Trong Shieh, I.-Ju Wei. Electrostatic Discharge Protection Design for High-Voltage Programming Pin in Fully-Silicided CMOS ICs. J. Solid-State Circuits, 46(2):537-545, 2011. [doi]

Abstract

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